diff --git a/diode_tester/Core/Tester_main/tester_func.c b/diode_tester/Core/Tester_main/tester_func.c
index b8529fd..fabd753 100644
--- a/diode_tester/Core/Tester_main/tester_func.c
+++ b/diode_tester/Core/Tester_main/tester_func.c
@@ -38,15 +38,22 @@ void TESTER_TestDiode_Forward(TESTER_TestHandleTypeDef *htest)
TESTER_Connect_Phase(&htest->SwPhaseForward);
/* Прямое включение на определенное время */
- uint32_t tickstart = HAL_GetTick();
- HAL_StatusTypeDef res;
- while(1)
+ if(htest->SwTimings.ticks_for_forward.msdelay)
{
- /* Считывание АЦП пока таймаут истечет */
- res = ADC_ReadContinuous(htest->adc, htest->continuous_buff_size, tickstart, htest->SwTimings.ticks_for_forward.ticks);
-
- if(res != HAL_OK)
- break;
+ uint32_t tickstart = HAL_GetTick();
+ HAL_StatusTypeDef res;
+ while(1)
+ {
+ /* Считывание АЦП пока таймаут истечет */
+ res = ADC_ReadContinuous(htest->adc, htest->continuous_buff_size, tickstart, htest->SwTimings.ticks_for_forward.ticks);
+
+ if(res != HAL_OK)
+ break;
+ }
+ }
+ else
+ {
+ TESTER_Delay(&htest->SwTimings.ticks_for_forward, &hmcstim);
}
/* Отключение питания от диода */
diff --git a/diode_tester/Core/Tester_main/tester_main.c b/diode_tester/Core/Tester_main/tester_main.c
index 34a1269..89cb720 100644
--- a/diode_tester/Core/Tester_main/tester_main.c
+++ b/diode_tester/Core/Tester_main/tester_main.c
@@ -162,17 +162,17 @@ void TESTER_InterfaceHandle(TESTER_ProjectTypeDef *tester)
*/
void TESTER_UpdateSettings(TESTER_TestHandleTypeDef *htest, MB_DataStructureTypeDef *mbdata)
{
+ htest->SwTimings.ticks_for_forward.ticks = mbdata->HoldRegs.TimeForForward;
htest->SwTimings.ticks_for_reverse.ticks = mbdata->HoldRegs.TimeForReverse;
+ htest->SwTimings.ticks_before_test.ticks = mbdata->HoldRegs.TimeBeforeTest;
htest->SwTimings.ticks_deadtime.ticks = mbdata->HoldRegs.TimeDeadtime;
htest->SwTimings.ticks_before_expected_peak.ticks = mbdata->HoldRegs.TimeBeforePeak;
- htest->SwTimings.ticks_before_test.ticks = mbdata->HoldRegs.TimeBeforeTest;
- htest->SwTimings.ticks_for_forward.ticks = mbdata->HoldRegs.TimeForForward;
+ htest->SwTimings.ticks_for_forward.msdelay = mbdata->Coils.msTimeForForward_enable;
htest->SwTimings.ticks_for_reverse.msdelay = mbdata->Coils.msTimeForReverse_enable;
+ htest->SwTimings.ticks_before_test.msdelay = mbdata->Coils.msTimeBeforeTest_enable;
htest->SwTimings.ticks_deadtime.msdelay = mbdata->Coils.msTimeDeadtime_enable;
htest->SwTimings.ticks_before_expected_peak.msdelay = mbdata->Coils.msTimeBeforePeak_enable;
- htest->SwTimings.ticks_before_test.msdelay = mbdata->Coils.msTimeBeforeTest_enable;
- htest->SwTimings.ticks_before_test.msdelay = mbdata->Coils.msTimeForForward_enable;
TESTER_ADC_UpdateSettings(htest->adc, mbdata);
}
diff --git a/diode_tester/MDK-ARM/diode_tester.uvoptx b/diode_tester/MDK-ARM/diode_tester.uvoptx
index 3347148..b975ebc 100644
--- a/diode_tester/MDK-ARM/diode_tester.uvoptx
+++ b/diode_tester/MDK-ARM/diode_tester.uvoptx
@@ -148,7 +148,24 @@
-U005600373433510237363934 -O2254 -SF10000 -C0 -A0 -I0 -HNlocalhost -HP7184 -P1 -N00("ARM CoreSight SW-DP (ARM Core") -D00(1BA01477) -L00(0) -TO131090 -TC10000000 -TT10000000 -TP21 -TDS8007 -TDT0 -TDC1F -TIEFFFFFFFF -TIP8 -FO7 -FD20000000 -FC800 -FN1 -FF0STM32F10x_128.FLM -FS08000000 -FL08000 -FP0($$Device:STM32F103C6$Flash\STM32F10x_128.FLM) -WA0 -WE0 -WVCE4 -WS2710 -WM0 -WP2
-
+
+
+ 0
+ 0
+ 87
+ 1
+ 134244302
+ 0
+ 0
+ 0
+ 0
+ 0
+ 1
+ ..\Core\Tester_main\tester_main.c
+
+ \\diode_tester\../Core/Tester_main/tester_main.c\87
+
+
0